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> Products > Wafer Processing Systems > Chemical Mechanical Planarization Systems

Chemical Mechanical Planarization Systems

Industry-leading reliability and performance for advanced semiconductor processes, offering flexible 200mm and 300mm platforms with dry in/dry out integrated cleaning, high throughput, and scalable configurations for both production and development environments.

Advanced CMP Systems for Semiconductor Manufacturing

EBARA Technologies’ CMP systems deliver high-performance planarization for advanced semiconductor manufacturing, supporting processes such as copper, oxide, tungsten, and STI across multiple technology nodes. The lineup includes the 300mm F-REX300XA and F-REX300X platforms, along with the 200mm F-REX200M2, all featuring dual-module architectures, dry in/dry out operation, and flexible configurations for high productivity, process stability, and improved yield.

Model F-REX300XA

Model F-REX300XA

The F-REX300XA is a next-generation 300mm CMP system featuring a dual-module design, advanced transport mechanism, and flexible configuration to deliver higher throughput, improved yield, and reduced power consumption for sustainable semiconductor manufacturing.

Model F-REX300X

Model F-REX300X

The F-REX300X is a high-performance 300mm CMP system with a dual-module architecture, multi-step chemical cleaning, and flexible configurations, enabling high throughput, continuous operation, and reliable process performance for both production and development.

Model F-REX200M2

Model F-REX200M2

The F-REX200M2 is a versatile 200mm CMP system designed for high process performance and throughput, featuring a dual-module system and flexible configurations to support both mass production and R&D applications.

Features

Dry-in/dry-out clean processing design
Dual-module system for continuous operation
High process performance and uniformity
High throughput and high operating rates
Multi-step chemical cleaning capability
Flexible system configuration and scalability
Optional endpoint detection monitoring
Optional in-line film thickness measurement
Advanced transport mechanism for productivity
Modular design for easy maintenance and upgrades

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